Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light.

نویسندگان

  • P Albella
  • J M Saiz
  • J M Sanz
  • F González
  • F Moreno
چکیده

We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe-surface distance or in the refractive index of the surface.

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عنوان ژورنال:
  • Optics letters

دوره 34 12  شماره 

صفحات  -

تاریخ انتشار 2009